ELECTRONIC
MATERIALS & PULSED LASER DEPOSITION
Equipment and Capabilities
Seven Independent LabVIEWÔ
Controlled Transport Measurement Systems
Electrical
Conductivity (4.2 K - 1000 K)
Thermoelectric Power (4.2 K - 1000 K)
Current vs. Voltage (4.2 K - 800 K)
Hall Effect (4.2 K - 400 K)
High Temperature System (4.2 K - 800 K)
ZT meter for up to 16 samples at a time (room temp)
ZT measurements on single samples (4.2 K - 400 K)
Scanning voltage probe (50µm resolution) (room temp)
Bell Jar based measurement system for thermoelectric module characterization
Small stainless steel vacuum chambers for long term thermoelectric module testing
Tube Furnace based measurement system for high temperature electrical conductivity and thermoelectric power measurements
The above systems include a number of Keithley instruments controlled by LabView based programs developed in our lab
6" diameter tube furnace for diffusion bonding under inert or forming gas environment
Sutter Instruments P-2000 Pipette Puller
South Bay Diamond Saw
EC400 Precision CNC Dicing/Cutting Saw by MTI
Leco SS-1000 Semi-Automatic Polisher Grinder System
Leica Microscope with ccd camera for image capture
Indigo Systems Merlin-Mid Thermographic camera
Janis Cryostat Probing station (4.2K - 400K) with 4 DC probes, and two 40 GHz probes
Netzsch STA 449 Jupiter coupled to QMS Aeolos for DSC/TGA thermal analysis (300K
- 1300K) coupled to a mass spectrometer to analyze off-gassing components
Pulsed Laser Deposition System
Lambda Physik LPX 210i Excimer Laser (248nm, 25ns, 1000mJ)
Custom UHV Chamber from Thermionics with load lock entry, 6 target carousel, optical substrate heating to 850º C in 50mTorr oxygen (1000º C in vacuum)
Second UHV deposition chamber for the deposition of additional materials also exists to avoid cross contamination of the above system
Tube furnace based deposition chamber for higher pressure depositions
Enwave Optronics Inc.: EZRaman-L Portable Raman Analyzer System, 785nm