News

  Lalita Udpa, a professor in the Department of Electrical and Computer Engineering, has been selected as a fellow of the Institute of Electrical and Electronics Engineers, Inc.(IEEE), effective January 1, 2008. She received this prestigious honor in recognition of her contributions to the development of forward and inverse electromagnetic nondestructive evaluation methodologies. She is also fellow of the American Society for Nondestructive Testing (ASNT).

The American Society for Nondestructive Testing (ASNT) has notified Dr. Lalita Udpa that she has been selected as an ASNT Fellow, Class of 2007. Her award will be presented durng the 2007 ASNT Fall Conference and Quality Testing Show in Las Vegas, Nevada, November 12-16, 2007. Congratulations, Lalita, on receiving this prestigious award!!

Lalita Udpa was among the winners of the FAA-ATA 2005 Nondestructive Testing “Better Way” Award, which was presented September 21 at the ATA Nondestructive Testing (NDT) Forum in Orlando, Florida. Udpa's team was recognized for their work on the "Turbo Magneto-Optic Imaging (MOI) for Inspection of Alodine fasteners," a sensitive system to detect surface and subsurface cracks in the lower row of rivets in aircraft lap splices. The existing eddy current technique requires inspection of each rivet individually.