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Zeiss Auriga Dual Column Focused Ion Beam SEM
The Spartan logo milled into silicon by the Gallium ion beam.
TEM specimens prepared by the FIB, ready for lift-out.
Graphene being moved across the sample to a trench.
The cross-section of a graphene-alumina composite, generated by the Ga ion beam.
Grains of a gold film, revealed after pollishing with the Ga ion beam.
A cross section of a leaf revelaing its internal structure.
Deadly nightshade, imaged under cryogenic temperatures.
Cross section of a deadly nightshade tricomb, milled and imaged under cryogenic temperatures.
Cross section of a mouse bone. Courtesy of Baumman, et al.
Microcantelever fabricated in the FIB.