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Zeiss Auriga Dual Column Focused Ion Beam SEM
The Spartan logo milled into silicon by the Gallium ion beam.
TEM specimens prepared by the FIB, ready for lift-out.
Graphene being moved across the sample to a trench.
The cross-section of a graphene-alumina composite, generated by the Ga ion beam.
Grains of a gold film, revealed after pollishing with the Ga ion beam.
A cross section of a leaf revelaing its internal structure.
Deadly nightshade, imaged under cryogenic temperatures.
Cross section of a deadly nightshade tricomb, milled and imaged under cryogenic temperatures.
Cross section of a mouse bone. Courtesy of Baumman, et al.
Microcantelever fabricated in the FIB.
Anter Thermal Conductivity Unite
ARES Rheometer
DSC Model Q2000 and TGA Model Q500
TMA Model Q400 and DMA Model Q800