MOVIES

Study of Dislocations in NiAl through the use of in-situ straining in Transmission Electron Microscopy
BY

B. Ghosh and M.A.Crimp

This work has been supported by Office of the Naval Research (Grant Number 0014-94-1-0204) - Scientific Officer: Dr. G. Yoder.
  1. High Purity <110> NiAl (Fast cooled)
  2. High Purity <110> NiAl (Slow cooled)
  3. Commercial Purity <110> NiAl (Fast cooled)
  4. Commercial Purity <110> NiAl (Slow cooled)
Details of the invesitgation will be published in Journal of Materials Science and Engineering.
Created on 06-03-1997
Last updated on 06-04-1997